Whitepaper: Particle Characterization with Dynamic Image Analysis
Posted: 30 August 2013 | Retsch Technology GmbH | No comments yet
Higher resolution, lower detection limit, and better reproducibility: that is what Dynamic Image Analysis offers the next generation of size analysis instruments. This whitepaper outlines how the method works, and shows application examples from typical granulation processes. Pros and cons compared to established methods, like sieving and laser diffraction, are discussed…
Higher resolution, lower detection limit, and better reproducibility: that is what Dynamic Image Analysis offers the next generation of size analysis instruments. This whitepaper outlines how the method works, and shows application examples from typical granulation processes. Pros and cons compared to established methods, like sieving and laser diffraction, are discussed.